System-on-Chip Test Data Compression Based on Split-Data Variable Length (SDV) Code
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Circuits and Systems
سال: 2016
ISSN: 2153-1285,2153-1293
DOI: 10.4236/cs.2016.78105